LEADER 01475nam 2200409 450 001 000002218 005 20070503173200.0 100 $a--------d1977----km-y0itay0103----ba 101 0 $aita 102 $aIT 200 1 $aEconomia e politica nella società sovietica$eIl dibattito economico nell'URSS da Bucharin alle riforme degli anni sessanta$fMoshe Lewin 200 1 $a1 $n0001916 210 $aRoma$cEditori Riuniti$d1977 215 $a333 p.$d21 cm. 225 1 $aBiblioteca di storia$fdiretta da Giuliano Procacci$v68 606 $aPolitica economica$yUnione sovietica$z1920-1970 676 $a338.947 700 1$aLewin,$bMoshe$0121424 801 0$aIT$bUniversità della Basilicata - B.I.A.$gRICA$2unimarc 912 $a000002218 996 $aEconomia e politica nella societ? sovietica$971402 997 $aUNIBAS BAS $aMONLET BAS $aMONOGR BAS $aLETTERE CAT $aCARLUCCI$b01$c19990820$lBAS01$h0958 CAT $c20000913$lBAS01$h1425 CAT $c20000920$lBAS01$h1829 CAT $c20001010$lBAS01$h1632 CAT $c20050601$lBAS01$h1752 CAT $abatch$b01$c20050718$lBAS01$h1047 CAT $c20050718$lBAS01$h1106 CAT $c20050718$lBAS01$h1136 CAT $c20050718$lBAS01$h1150 CAT $aBATCH$b00$c20070503$lBAS01$h1732 FMT Z30 -1$lBAS01$LBAS01$mBOOK$1BASA1$APolo Storico-Umanistico$2GEN$BCollezione generale$3FM/88270$9FM/88270$688270$5L88270$819990820$f02$FPrestabile Generale LEADER 01135nam 2200361 450 001 9910586640603321 005 20221013163608.0 010 $a1-80355-526-2 035 $a(CKB)4950000000722123 035 $a(NjHacI)994950000000722123 035 $a(EXLCZ)994950000000722123 100 $a20221013d2022 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aEnvironmental Impact and Remediation of Heavy Metals /$fedited by Hosam M. Saleh, Amal I. Hassan 210 1$aLondon :$cIntechOpen,$d2022. 215 $a1 online resource (316 pages) $cillustrations 311 $a1-80355-525-4 320 $aIncludes bibliographical references. 606 $aHeavy metals$xAbsorption and adsorption 615 0$aHeavy metals$xAbsorption and adsorption. 676 $a576.1 702 $aSaleh$b Hosam M. 702 $aHassan$b Amal I. 801 0$bNjHacI 801 1$bNjHacl 906 $aBOOK 912 $a9910586640603321 996 $aEnvironmental Impact and Remediation of Heavy Metals$92903380 997 $aUNINA LEADER 01766oam 2200517zu 450 001 9910146829703321 005 20241212215319.0 010 $a9781509097678 010 $a1509097678 035 $a(CKB)1000000000022601 035 $a(SSID)ssj0000396666 035 $a(PQKBManifestationID)12120027 035 $a(PQKBTitleCode)TC0000396666 035 $a(PQKBWorkID)10334531 035 $a(PQKB)11539136 035 $a(EXLCZ)991000000000022601 100 $a20160829d2005 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$a2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX 210 31$a[Place of publication not identified]$cInstitute of Electrical and Electronics Engineers$d2005 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780780390386 311 08$a0780390385 606 $aIntegrated circuits$xTesting$vCongresses 606 $aSemiconductors$xTesting$vCongresses 606 $aElectronics$vCongresses 606 $aElectrical Engineering$2HILCC 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 0$aIntegrated circuits$xTesting 615 0$aSemiconductors$xTesting 615 0$aElectronics 615 7$aElectrical Engineering 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 676 $a621.3815/48 712 02$aInstitute of Electrical and Electronics Engineers, 712 12$aInternational Test Conference. 801 0$bPQKB 906 $aPROCEEDING 912 $a9910146829703321 996 $a2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX$92382075 997 $aUNINA