01833nam0 2200397 i 450 VAN012581220220311092848.68N978981132571720191210d2018 |0itac50 baengSG|||| |||||Thermoelectrical Effect in SiC for High-Temperature MEMS SensorsToan Dinh, Nam-Trung Nguyen, Dzung Viet DaoSingaporeSpringer2018XI, 115 p.ill.24 cm001VAN01034342001 SpringerBriefs in applied sciences and technology210 BerlinSpringerSGSingaporeVANL000061530.41Fisica dello stato solido22620.5Nanotecnologia22621.39Microingegneria22620.1Scienze dei materiali22DinhToanVANV097219769346DaoDzung V.VANV097221787308NguyenNam-TrungVANV097220505357SpringerVANV108073650Dao, Dzung VietDao, Dzung V.VANV103791Dao, D. V.Dao, Dzung V.VANV205824Dao, D.V.Dao, Dzung V.VANV205826ITSOL20221125RICAhttps://link.springer.com/book/10.1007/978-981-13-2571-7E-book - Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHEIT-CE0101VAN17NVAN0125812BIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE17CONS e-book 2112 17BIB2112/304 304 20191210 Thermoelectrical Effect in SiC for High-Temperature MEMS Sensors1753961UNISOB