00989cam2 22002771 450 SOBE0004617020150302152011.0978883707819520150302d2010 |||||ita|0103 baitaIT<<6: >>Collezioni Settala e Litta Modignaniarti applicate da donazioni diversenumismaticaMilanoElectaIntesa SanPaolo2010441 p.ill.25x25 cmIn custodia001SOBE000461642001 Pinacoteca Ambrosiana6*Pinacoteca *AmbrosianaSOBA00010916070326973ITUNISOB20150302RICAUNISOBUNISOB700|Coll|75|K165549SOBE00046170M 102 Monografia moderna SBNM700|Coll|75|K000006SI16554920150227donoVmenleUNISOBUNISOB20150302151437.020150302151509.0menleCollezioni Settala e Litta Modignani1710649UNISOB02052oam 2200529zu 450 991087250930332120241212215300.0(CKB)1000000000021966(SSID)ssj0000394745(PQKBManifestationID)12171889(PQKBTitleCode)TC0000394745(PQKBWorkID)10388755(PQKB)11789495(EXLCZ)99100000000002196620160829d2005 uy engtxtccr5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004[Place of publication not identified]IEEE Computer Society2005Bibliographic Level Mode of Issuance: Monograph9780769523200 076952320X MicroprocessorsTestingCongressesIntegrated circuitsTestingCongressesIntegrated circuitsVerificationCongressesSystems on a chipTestingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCMicroprocessorsTestingIntegrated circuitsTestingIntegrated circuitsVerificationSystems on a chipTestingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences004.16IEEE Xplore (Online service)IEEE Computer Society Technical Council on Test Technology.International Workshop on Microprocessor Test and VerificationPQKBPROCEEDING99108725093033215th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 20042350004UNINA