00809cam0 22002651 450 SOBE0003440320130619134134.020130619d1971 |||||ita|0103 baitaITEconomia del lavoroBrian J. McCormickBolognaIl Mulino1971205 p.22 cmSerie di economia001SOBE000281372001 *Serie di economiaMcCormick, Brian J.SOBA00007531070264953ITUNISOB20130619RICAUNISOBUNISOB33025079SOBE00034403M 102 Monografia moderna SBNM330000341SI25079rovitoUNISOBUNISOB20130619133943.020130619134006.0rovitoWages14241UNISOB01757nam 2200385 450 991013718140332120230425080556.01-4673-6578-510.1109/ITC33753.2015(CKB)3710000000534614(NjHacI)993710000000534614(EXLCZ)99371000000053461420230425d2015 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierTest Conference (ITC), 2015 IEEE International /Institute of Electrical and Electronics EngineersPiscataway, NJ :IEEE,2015.1 online resource (various pagings) illustrations1-4673-6579-3 International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.2015 IEEE International Test Conference 2015 IEEE International Test Conference (ITC)Test Conference Computer softwareTestingCongressesComputer softwareTesting005.14NjHacINjHaclPROCEEDING9910137181403321Test Conference (ITC), 2015 IEEE International2536343UNINA