00951cam0 2200253 450 E60020006609820210907070631.020100901d1953 |||||ita|0103 bafreIT<<Le >>voyage de monsieur Perrichoncomedie. Représentée pour la première fois à Paris le 10 septembre 1860Eugène Labicheintroduzione e note di Luisa Giacometti DreyfusMilanoSignorelli195384 p.19 cmLabiche, EugèneA600200062106070396096Giacometti Dreyfus, LuisaA600200062107070ITUNISOB20210907RICAUNISOBUNISOB8405289E600200066098M 102 Monografia moderna SBNM840000320Si5289AcquistovittoriniUNISOBUNISOB20100901120354.020150916101836.0AlfanoVoyage de Monsieur Perrichon533741UNISOB01862nam 2200565 a 450 991045297720332120200520144314.01-61668-608-1(CKB)2550000001042409(EBL)3020136(SSID)ssj0000853338(PQKBManifestationID)12365048(PQKBTitleCode)TC0000853338(PQKBWorkID)10864822(PQKB)10966323(MiAaPQ)EBC3020136(Au-PeEL)EBL3020136(CaPaEBR)ebr10675144(OCoLC)923662693(EXLCZ)99255000000104240920100324d2010 uy 0engur|n|---|||||txtccrColor[electronic resource] ontological status and epistemic role /Anna StorozhukNew York. Nova Science Publishers20101 online resource (78 p.)Chaos and complexity research compendium ;v. 1Eye and vision research developmentsDescription based upon print version of record.1-61668-201-9 Includes bibliographical references and index.The physical properties of color and its influence on the organism -- The source of the myths about experience : the principle of the being and thinking identity.Eye and vision research developments series.Color (Philosophy)Color visionElectronic books.Color (Philosophy)Color vision.111/.1Storozhuk A. I͡U(Anna I͡Urʹevna)900833MiAaPQMiAaPQMiAaPQBOOK9910452977203321Color2013256UNINA05336nam 22006733u 450 99621625840331620230725041159.01-280-55760-597866105576083-527-60016-7(CKB)1000000000019319(EBL)822727(OCoLC)768732534(SSID)ssj0000310784(PQKBManifestationID)11264590(PQKBTitleCode)TC0000310784(PQKBWorkID)10312957(PQKB)10986897(MiAaPQ)EBC5247739(Au-PeEL)EBL5247739(CaONFJC)MIL55760(OCoLC)1027167757(EXLCZ)99100000000001931920131028d2011|||| u|| |engur|n|---|||||txtccrSurface and Thin Film Analysis A Compendium of Principles, Instrumentation and Applications2nd ed.Hoboken Wiley20111 online resource (559 p.)Description based upon print version of record.3-527-30458-4 Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications; Contents; Preface to the First Edition; Preface to the Second Edition; List of Contributors; 1: Introduction; Part One: Electron Detection; 2: X-Ray Photoelectron Spectroscopy (XPS); 2.1 Principles; 2.2 Instrumentation; 2.2.1 Vacuum Requirements; 2.2.2 X-Ray Sources; 2.2.3 Synchrotron Radiation; 2.2.4 Electron Energy Analyzers; 2.2.5 Spatial Resolution; 2.3 Spectral Information and Chemical Shifts; 2.4 Quantification, Depth Profiling, and Imaging; 2.4.1 Quantification; 2.4.2 Depth Profiling2.4.3 Imaging2.5 The A uger Parameter; 2.6 Applications; 2.6.1 Catalysis; 2.6.2 Polymers; 2.6.3 Corrosion and Passivation; 2.6.4 Adhesion; 2.6.5 Superconductors; 2.6.6 Semiconductors; 2.7 Ultraviolet Photoelectron Spectroscopy (UPS); References; 3: Auger Electron Spectroscopy (AES); 3.1 Principles; 3.2 Instrumentation; 3.2.1 Vacuum Requirements; 3.2.2 Electron Sources; 3.2.3 Electron-Energy Analyzers; 3.3 Spectral Information; 3.4 Quantification and Depth Profiling; 3.4.1 Quantification; 3.4.2 Depth Profiling; 3.5 Applications; 3.5.1 Grain Boundary Segregation; 3.5.2 Semiconductor Technology3.5.3 Thin Films and Interfaces3.5.4 Surface Segregation; 3.6 Scanning A uger Microscopy (SAM); References; 4: Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtering Transmission Electron Microscopy (EFTEM); 4.1 Principles; 4.2 Instrumentation; 4.3 Qualitative Spectral Information; 4.3.1 Low-Loss Excitations; 4.3.2 Ionization Losses; 4.3.3 Fine Structures; 4.4 Quantification; 4.5 Imaging of Element Distribution; 4.6 Summary; References; 5: Low-Energy Electron Diffraction (LEED); 5.1 Principles and History; 5.2 Instrumentation; 5.3 Qualitative Information; 5.3.1 LEED Pattern5.3.2 Spot Profile Analysis5.3.3 Applications and Restrictions; 5.4 Quantitative Structural Information; 5.4.1 Principles; 5.4.2 Experimental Techniques; 5.4.3 Computer Programs; 5.4.4 Applications and Restrictions; 5.5 Low-Energy Electron Microscopy; 5.5.1 Principles of Operation; 5.5.2 Applications and Restrictions; References; 6: Other Electron-Detecting Techniques; 6.1 Ion (Excited) Auger Electron Spectroscopy (IAES); 6.2 Ion Neutralization Spectroscopy (INS); 6.3 Inelastic Electron Tunneling Spectroscopy (IETS); Reference; Part Two: Ion Detection7: Static Secondary Ion Mass Spectrometry (SSIMS)7.1 Principles; 7.2 Instrumentation; 7.2.1 Ion Sources; 7.2.2 Mass Analyzers; 7.2.2.1 Quadrupole Mass Spectrometers; 7.2.2.2 Time-of-Flight Mass Spectrometry (TOF-MS); 7.3 Quantification; 7.4 Spectral Information; 7.5 Applications; 7.5.1 Oxide Films; 7.5.2 Interfaces; 7.5.3 Polymers; 7.5.4 Biosensors; 7.5.5 Surface Reactions; 7.5.6 Imaging; 7.5.7 Ultra-Shallow Depth Profiling; References; 8: Dynamic Secondary Ion Mass Spectrometry (SIMS); 8.1 Principles; 8.1.1 Compensation of Preferential Sputtering; 8.1.2 Atomic Mixing8.1.3 Implantation of Primary IonsSurveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.Thin filmsAnalysisSurfacesElectron spectroscopySpectrum analysisThin filmsAnalysisSurfacesElectron spectroscopySpectrum analysis530.4275541.33Bubert Henning903323Jenett Holger921755AU-PeELAU-PeELAU-PeELBOOK996216258403316Surface and Thin Film Analysis2068027UNISA01890nam 2200409 450 991038974420332120231211115052.01-5044-6351-X10.1109/IEEESTD.2020.9068517(CKB)5280000000208146(NjHacI)995280000000208146(EXLCZ)99528000000020814620231211d2020 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier644-2019 - IEEE Standard Procedures for Measurement of Power Frequency Electric and Magnetic Fields from AC Power Lines /IEEENew York. :IEEE,2020.1 online resource (40 pages)Uniform procedures for the measurement of power frequency electric and magnetic fields from alternating current (ac) overhead power lines and for the calibration of the meters used in these measurements are established in this standard. The procedures apply to the measurement of electric and magnetic fields close to ground level. The procedures can also be tentatively applied (with limitations, as specified in the standard) to electric fields near an energized conductor or structure.Electric fieldsMeasurementMagnetic fieldsMeasurementElectric linesStandardsElectric power transmissionStandardsElectric fieldsMeasurement.Magnetic fieldsMeasurement.Electric linesStandards.Electric power transmissionStandards.530.141015194NjHacINjHaclDOCUMENT9910389744203321644-2019 - IEEE Standard Procedures for Measurement of Power Frequency Electric and Magnetic Fields from AC Power Lines2582641UNINA01479nam0 22002771i 450 UON0008007520231205102425.73620020107d1604 |0itac50 balatIT|||| |||||Ioannis Pierii Valeriani Bellunensis, hierogliphica, seu de sacris Aegyptiorum, aliarumque gentium literis commentariiSumma cum industria exarati, & in libros quinquaginta octo redactiquibus etiam duo alij ab eruditissimo viro sunt annexicum indice geminoVenetiisapud Io. Antonium, & Iacobum de Franciscis1604[60], 654, 47 p.33 cm*escluso dal prestito. - data inesattaIT-UONSI EGIa/054 rariSCRITTURA EGIZIANA ANTICAGeroglificoInterpretazione simbolicaUONC024413FIITVeneziaUONL000039493.1LINGUA EGIZIANA ANTICA21IOANNES Pierius ValerianusUONV052642290342de FranciscisUONV258850650ITSOL20240220RICASIBA - SISTEMA BIBLIOTECARIO DI ATENEOUONSIUON00080075SIBA - SISTEMA BIBLIOTECARIO DI ATENEOSI EG I a 054 rari SI MR 18232 7 054 rari *escluso dal prestito. - data inesattaIoannis Pierii Valeriani Bellunensis, hierogliphica, seu de sacris Aegyptiorum, aliarumque gentium literis commentarii1301745UNIOR