01032cam0 2200265 450 E60020005823320160422110559.020100112d1967 |||||ita|0103 baitaIT"SPR HHTWM" e "SPR HGLWY" di Ger., XXXII, 7-14 nell'interpretazione dei padri della chiesaDaniela PiattelliMilanoGiuffrè19676 p.24 cm(mm)Estr. da: Rivista italiana per le scienze giuridiche, vol. 11. (1963)Piattelli, DanielaA600200054754070234703ITUNISOB20160422RICAUNISOBUNISOBFondo|Casavola|Opusc148434E600200058233M 102 Monografia moderna SBNMFondo|Casavola|Opusc000138Si148434CasavoladonomenleUNISOBUNISOB20100112142319.020160422110559.0petrellap"SPR HHTWM" e "SPR HGLWY" di Ger., XXXII, 7-14 nell'interpretazione dei padri della chiesa1706739UNISOB05363nam 2200661Ia 450 991045824730332120200520144314.01-281-07307-597866110730770-08-051823-01-4175-2668-8(CKB)1000000000384755(EBL)318291(OCoLC)182732156(SSID)ssj0000254014(PQKBManifestationID)11221055(PQKBTitleCode)TC0000254014(PQKBWorkID)10206375(PQKB)10790314(MiAaPQ)EBC318291(Au-PeEL)EBL318291(CaPaEBR)ebr10203589(CaONFJC)MIL107307(EXLCZ)99100000000038475520020218d2002 uy 0engurcn|||||||||txtccrSurfaces and their measurement[electronic resource] /David WhitehouseLondon HPS20021 online resource (425 p.)Description based upon print version of record.1-903996-01-5 Includes bibliographical references and index.Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation)10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 ConclusionsChapter 12. Cylindricity, sphericityThe importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation.· Written by one of the world'sSurfaces (Technology)MeasurementCivil engineeringElectronic books.Surfaces (Technology)Measurement.Civil engineering.620.110287620.44Whitehouse D. J(David J.)888020MiAaPQMiAaPQMiAaPQBOOK9910458247303321Surfaces and their measurement2062260UNINA01202nam a2200265 i 4500991004121129707536090129s2006 it 000 0 ita d9788886444524b13805629-39ule_instDip.to Filosofiaita370Abc della cittadinanza europea :parole, cultura identita /Franco Priore ed. ; presentazione di Angelo Carrieri Lecce :Martano,2006325 p. :ill. ;24 cmCittadinanzaEuropaCarrieri, Angelo Priore, Francoauthorhttp://id.loc.gov/vocabulary/relators/aut478205.b1380562910-05-1229-01-09991004121129707536LE005 370 PRI01. 0212005000192531le005-E20.00-l- 02120.i1492303829-01-09LE022 370 PRI02.0112022000123440le022gE20.00-l- 00000.i1521279821-12-10LE022 370 PRI02.01 C.0212022000136013le022gE20.00-l- 00000.i1540801210-05-12Abc della cittadinanza europea1465023UNISALENTOle005le02229-01-09ma -itait 00