01691nam0 22003733i 450 UBO146858320251003044420.00195140168hbk20090727d2001 ||||0itac50 baengusz01i xxxe z01nˆAn ‰introduction to mixed-signal IC test and measurementMark Burns, Gordon W. RobertsNew YorkOxfordOxford University Press2001XX, 684 p.ill.25 cm.ˆThe ‰Oxford series in electrical and computer engineering001PUV03239582001 ˆThe ‰Oxford series in electrical and computer engineeringCircuiti integratiFIRCFIC002586E621.3815ELETTRONICA. COMPONENTI E CIRCUITI14621.381522ChipCircuiti elettronici integratiCircuiti integratiChipCircuiti integratiCircuiti elettronici integratiBurns, Mark <1962- >UBOV564213070771937Roberts, Gordon W.RMSV005939070770532ITIT-00000020090727IT-BN0095 NAP 01SALA DING $UBO1468583Biblioteca Centralizzata di Ateneo1 v. in due copie 01SALA DING 621.3815 BUR.in 0102 0000055305 VMA A4(bis 1 v. (2. copia)Y 20050111201210191 v. in due copie 01SALA DING 621.3815 BUR.in 0102 0000056455 VMA 1 v.Y 2005030120050301 01Introduction to mixed-signal IC test and measurement1575656UNISANNIO