02059nam0 22004453i 450 UBO141190520251003044420.00792379918hdbk acid-free20100726d2000 ||||0itac50 baengengusz01i xxxe z01nz01ncRDAcarrierEssentials of electronic testing for digital, memory and mixed-signal VLSI circuitsMichael L. Bushnell, Vishwani D. AgrawalBoston [etc.]Kluwer Academicc2000XVIII, 690 p.26 cm.Frontiers in electronic testing17001UBO14119132001 Frontiers in electronic testing17Essentials of electronic testing for digital, memory and mixed-signal VLSI circuitsUBO4614825UBOV5423241575653CIRCUITI INTEGRATIPROVEFIRMILC113505ICircuiti integrati VLSIFIRUFIC009287E621.39INGEGNERIA DEGLI ELABORATORI14621.395INGEGNERIA DEGLI ELABORATORI. CIRCUITERIA22ChipCircuiti elettronici integratiCircuiti a larghissima scala di integrazioneCircuiti VLSICircuiti integratiChipCircuiti integratiCircuiti elettronici integratiCircuiti integrati VLSICircuiti a larghissima scala di integrazioneCircuiti integrati VLSICircuiti VLSIBushnell, Michael Lee <1950- >UBOV542324070771935Agrawal, Vishwani D. <1943- >UBOV542325070771936ITIT-00000020100726IT-BN0095 NAP 01SALA DING $UBO1411905Biblioteca Centralizzata di Ateneo1 v. 01SALA DING 621.39 BUS.es 0102 0000056375 VMA A4 1 v.Y 2005020720050207 01Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits1575653UNISANNIO