01186nam0 22002893i 450 UAN000228820241227063149.0044200636520100219d1993 ||||0itac50 baengusz01i xxxe z01nHigh frequency measurements and noise in electronic circuitsDouglas C. SmithNew YorkVan Nostrand Reinholdc1993XIV, 231 p.ill.24 cm.Strumenti per misure elettronicheFIRNAPC012245I621.3815ELETTRONICA. COMPONENTI E CIRCUITI14621.381548INGEGNERIA ELETTRONICA. COMPONENTI E CIRCUITI. COMPONENTI PER PROVE E MISURE22Smith, Douglas Charles <1947- >UANV001193070771851ITIT-NA007920100219IT-BN0095 UAN0002288Biblioteca Centralizzata di Ateneo1 v.1 v. 01SALA DING 621.3815 SMI.hi 0102 0000060465 B A4 1 v.3 2006112020061120 01High frequency measurements and noise in electronic circuits1575437UNISANNIO