01554nam0 22003613i 450 MIL070310620250124062914.00521024455pbk9780521024457pbk20091005e20061996||||0itac50 baenggbz01i xxxe z01nPhotoinduced defects in semiconductorsDavid Redfield and Richard H. BubeCambridgeCambridge University press2006X, 217 p.ill.23 cmCambridge studies in semiconductor physics and microelectronic engineering4Ripr. facs. dell'ed.: Cambridge : Cambridge University press, 1996.001PUV01456402001 Cambridge studies in semiconductor physics and microelectronic engineering4SemiconduttoriDifettiFIRNAPC243128IFOTOCHIMICAFIRNAPC000967I621.3815ELETTRONICA. COMPONENTI E CIRCUITI14621.38152Elettronica. Componenti e circuiti. Semiconduttori22Redfield, DavidRMSV017932070726820Bube, Richard H. <1927- >MILV088861070770669ITIT-NA007920091005IT-BN0095 MIL0703106Biblioteca Centralizzata di Ateneo1 v. 01SALA DING 621.3815 RED.ph 0102 0000060595 B A4 1 v.3 2007010820070108 01Photoinduced defects in semiconductors1572603UNISANNIO