01795nam0 22003733i 450 MIL030256320250207062544.0079239564620091130d1995 ||||0itac50 baengusz01i xxxe z01nAnalog signal generation for Built-in-self-test of mixed-signal integrated circuitsby Gordon W. Roberts, Albert K. LuBoston [etc.]Kluwer Academicc1995VIII, 122 p.23 cm˜The œKluwer international series in engineering and computer science. Analog circuits and signal processing312Bibliografia: P. 117-119.001MIL01357372001 ˜The œKluwer international series in engineering and computer science. Analog circuits and signal processing312Circuiti integratiProgettazioneFIRNAPC221616ICircuiti integratiProveFIRNAPC270102ERivelatoriFIRNAPC073284IStrumenti elettronici per misureFIRCFIC101066I621.3815ELETTRONICA. COMPONENTI E CIRCUITI14621.381548INGEGNERIA ELETTRONICA. COMPONENTI E CIRCUITI. COMPONENTI PER PROVE E MISURE22Roberts, Gordon W.RMSV005939070770532Lu, Albert K. <1969- >MILV171247070770533ITIT-NA007920091130IT-BN0095 MIL0302563Biblioteca Centralizzata di Ateneo1 v. 01SALA DING 621.3815 ROB.an 0102 0000028525 B A4 1 v.3 1997121219971212 01Analog signal generation for Built-in-self-test of mixed-signal integrated circuits1572322UNISANNIO