00913nam a2200217 i 450099100435733770753620241211103259.0241211s1999 ne a frb 001 0 eng d9036513979Bibl. Dip.le Aggr. Ingegneria Innovazione - Sez. IngegneriaInnovazioneengSocioculturale Scseng621.381523Petrescu, Violeta1777884Electromigration induced stress, a study into current induced resistance changes in VLSI interconnects :proefschrift /Violeta PetrescuNetherlands,1999172 p. ;25 cmInterconnects (Integrated circuit technology)MaterialsDissertations, AcademicElectrodiffusion991004357337707536Electromigration induced stress, a study into current induced resistance changes in VLSI interconnects4300017UNISALENTO