01643nam a2200349 i 4500991001850459707536121011s2010 riua b 100 0 eng d9780821848920b14080709-39ule_instDip.to Matematica e Fisicaeng514.22322AMS 57R17AMS 37J05AMS 28D05LC QA613.6.A47AMS-IMS-SIAM Joint Summer Research Conference<2007 :Snowbird, Utah>477596Symplectic topology and measure preserving dynamical systems :AMS-IMS-SIAM Joint Summer Research Conference, July 1-5, 2007, Snowbird, Utah /Albert Fathi, Yong-Geun Oh, Claude Viterbo, editorsProvidence, R. I. :American Mathematical Society,c2010ix, 177 p. :ill. ;26 cmContemporary mathematics,0271-4132 ;512Includes bibliographical referencesSimplexes (Mathematics)CongressesDiffeomorphismsCongressesFathi, Albertauthorhttp://id.loc.gov/vocabulary/relators/aut41596Oh, Yong-Geunauthorhttp://id.loc.gov/vocabulary/relators/aut732183Viterbo, Claudeauthorhttp://id.loc.gov/vocabulary/relators/aut732184.b1408070913-11-1211-10-12991001850459707536LE013 57R FAT11 (2010)12013000216799le013pE68.00-l- 03030.i1545482408-11-12Symplectic topology and measure preserving dynamical systems1442549UNISALENTOle01311-10-12ma -engriu0001023nam a2200277 i 4500991003094729707536071206s1998 ne b 001 eng d90272506771556198167 (US)b13628458-39ule_instDip.to Lingueita507.2 Hyland, Ken280575Hedging in Scientific Research Articles /Ken HylandAmsterdam ;Philadelphia :John Benjamins,1998ix, 307 p ;23 cmPragmatics & Beyond. New Series ;v. 54Contiene riferimenti bibliografici ed indiceRicerca scientificaMetodologiaEditoria scientifica.b1362845828-01-1406-12-07991003094729707536LE012 507.2 HYL12012000256781le012-E0.00-l- 01010.i1462865x06-12-07Hedging in scientific research articles704670UNISALENTOle01206-12-07ma -engne 0001691nam0 22003733i 450 UBO146858320251003044420.00195140168hbk20090727d2001 ||||0itac50 baengusz01i xxxe z01nˆAn ‰introduction to mixed-signal IC test and measurementMark Burns, Gordon W. RobertsNew YorkOxfordOxford University Press2001XX, 684 p.ill.25 cm.ˆThe ‰Oxford series in electrical and computer engineering001PUV03239582001 ˆThe ‰Oxford series in electrical and computer engineeringCircuiti integratiFIRCFIC002586E621.3815ELETTRONICA. COMPONENTI E CIRCUITI14621.381522ChipCircuiti elettronici integratiCircuiti integratiChipCircuiti integratiCircuiti elettronici integratiBurns, Mark <1962- >UBOV564213070771937Roberts, Gordon W.RMSV005939070770532ITIT-00000020090727IT-BN0095 NAP 01SALA DING $UBO1468583Biblioteca Centralizzata di Ateneo1 v. in due copie 01SALA DING 621.3815 BUR.in 0102 0000055305 VMA A4(bis 1 v. (2. copia)Y 20050111201210191 v. in due copie 01SALA DING 621.3815 BUR.in 0102 0000056455 VMA 1 v.Y 2005030120050301 01Introduction to mixed-signal IC test and measurement1575656UNISANNIO