01458nam a2200325 i 4500991001789879707536060721s2003 nyua b 001 0 eng d0306472929b1342760x-39ule_instDip.to Fisicaeng502.8252153.0.692LC QH212.S3Scanning electron microscopy and x-ray microanalysis /Joseph I. Goldstein ... [et al.]3rd ed.New York :Kluwer Academic/Plenum,c2003xix, 689 p. :ill. (some col.) ;26 cm. +1 CD-ROM (4 3/4 in.)Includes bibliographical references and indexScanning electron microscopyX-ray microanalysisGoldstein, Joseph.b1342760x08-07-1521-07-06991001789879707536LE006 53.0.692 GOL12006000157841le006pE59.95-l- 09890.i1427429221-07-06LE006 53.0.692 GOL12006000161398le006pE62.35-l- 04040.i1465039316-01-08LE006 53.0.692 GOL12006000161381le006pE62.35-l- 03030.i1465040x16-01-08LE006 53.0.692 GOL12006000161374le006pE62.35-l- 05050.i1465041116-01-08Scanning electron microscopy and x-ray microanalysis125909UNISALENTOle00621-07-06ma -engnyu00