01166nam a2200313 i 4500991001789629707536060721s2002 gw a b 001 0 eng d3540437649 (alk. paper)b13427581-39ule_instDip.to Fisicaeng620.1/129921LC TA417.2353.7.18Fultz, Brent624062Transmission electron microscopy and diffractometry of materials /Brent Fultz, James Howe2. ed.Berlin ;New York :Springer,c2002xxi, 748 p. :ill. ;24 cmIncludes bibliographical references and indexMaterialsMicroscopyTransmission electron microscopyX-ray diffractometerHowe, James M..b1342758121-09-0621-07-06991001789629707536LE006 53.7.18 FUL12006000157858le006pE82.95-l- 07970.i1427427921-07-06Transmission electron microscopy and diffractometry of materials1097557UNISALENTOle00621-07-06ma -enggw 00