01076nam a2200277 i 4500991001754869707536090910s2001 enka b 001 0 eng d0748409688b14065046-39ule_instDip.to Ingegneria dell'Innovazioneeng502.82521Goodhew, Peter J.477169Electron microscopy and analysis /Peter J. Goodhew, John Humphreys, Richard Beanland3rd ed.London ;New York :Taylor & Francis,2001x, 251 p. :ill. ;24 cmIncludes bibliographical references and indexElectron microscopyHumphreys, F. J.Beanland, R..b1406504628-01-1414-06-12991001754869707536LE026 502.825 GOO 01.01 200112026000061122le026Prof. Lovergine / BibliotecapE45.31-l- 44140.i1542289614-06-12Electron microscopy and analysis239805UNISALENTOle02610-09-09ma -engenk00