01306nam a2200325 i 450099100071625970753620020507172646.0940926s1994 us ||| | eng 0471924164b10747254-39ule_instLE01301156ExLDip.to Matematicaeng519.542AMS 62A15QA279.5B47Bernardo, Jose M.350387Bayesian theory /Jose M. Bernardo, Adrian F. M. SmithChichester ; New York :J. Wiley & Sons,c1994xiv, 586 p. ;24 cmWiley series in probability and mathematical statistics.Probability and mathematical statistics,0271-6232Includes bibliographical references and indexesBayesian statistical decision theorySmith, Adrian F.M..b1074725423-02-1728-06-02991000716259707536LE013 62A BER11 (1994)12013000026794le013-E0.00-l- 00000.i1083960428-06-02LE025 ECO 519.5 BER02.0112025000122017le025-E0.00-l- 01010.i1457543708-10-07Bayesian theory383463UNISALENTOle013le02501-01-94ma -engus 0101076nam a2200277 i 4500991001754869707536090910s2001 enka b 001 0 eng d0748409688b14065046-39ule_instDip.to Ingegneria dell'Innovazioneeng502.82521Goodhew, Peter J.477169Electron microscopy and analysis /Peter J. Goodhew, John Humphreys, Richard Beanland3rd ed.London ;New York :Taylor & Francis,2001x, 251 p. :ill. ;24 cmIncludes bibliographical references and indexElectron microscopyHumphreys, F. J.Beanland, R..b1406504628-01-1414-06-12991001754869707536LE026 502.825 GOO 01.01 200112026000061122le026Prof. Lovergine / BibliotecapE45.31-l- 44140.i1542289614-06-12Electron microscopy and analysis239805UNISALENTOle02610-09-09ma -engenk00