01248nam a2200325 i 450099100116364970753620020507112118.0970308s1975 us ||| | eng b10182597-39ule_instLE00643198ExLDip.to Fisicaita53.0.6453.0.692502.8GH212Yakowitz, H.19726Practical scanning electron microscopy :electron and ion microprobe analysis /edited J.I. Goldstein and H. Yakowitz ; foreword by T.E. EverhartNew York :Plenum Press,1975xviii, 582 p. :ill. ;24 cm.Microprobe analysisScanning electron microscopeGoldstein, Joseph I.Everhart, T.E..b1018259721-09-0627-06-02991001163649707536LE006 53.0.692 GOL12006000039888le006nE0.00-lm 00000.i1022375727-06-02LE006 53.0.692 GOL12006000181648le006-E0.00-l- 00000.i1022376927-06-02Practical scanning electron microscopy190644UNISALENTOle00601-01-97ma -engus 02