01456nam 2200469Ia 450 991045009130332120200520144314.00-08-048807-21-281-02015-X9786611020156(CKB)1000000000106710(MiAaPQ)EBC226707(Au-PeEL)EBL226707(CaPaEBR)ebr10128135(CaONFJC)MIL102015(OCoLC)171114406(EXLCZ)99100000000010671020040618d2004 uy 0engurcn|||||||||Accelerated testing and validation[electronic resource] testing, engineering, and management tools for lean development /by Alex PorterAmsterdam ;London Newnes2004xii, 242 p. ill0-7506-7653-1 1-4175-3713-2 Includes bibliographical references and index.Accelerated life testingReliability (Engineering)Failure time data analysisElectronic books.Accelerated life testing.Reliability (Engineering)Failure time data analysis.620.00452Porter Alex1000006MiAaPQMiAaPQMiAaPQBOOK9910450091303321Accelerated testing and validation2295552UNINA01245nam a2200385 i 450099100110171970753620020507183306.0930928s1989 us ||| | eng 0821815318b10801133-39ule_instLE01307051ExLDip.to Matematicaeng512.72AMS 11D09AMS 11H50AMS 11JAMS 11J04AMS 11J06AMS 11J70AMS 11K55QA242.C84Cusick, Thomas W.283857The Markoff and Lagrange spectra /Thomas W. Cusick, Mary E. FlahiveProvidence :American Mathematical Society,1989ix, 97 p. ;26 cmMathematical surveys and monographs,0076-5376 ;30Lagrange spectrumMarkov spectrumFlahive, Mary E..b1080113323-02-1728-06-02991001101719707536LE013 11J CUS11 (1989)12013000073880le013-E0.00-l- 00000.i1090504228-06-02Markoff and Lagrange spectra925412UNISALENTOle01301-01-93ma -engus 41