01894nam a2200385 i 4500991000937889707536040317s mau 000 0 eng d1402075278b12692992-39ule_instDip.to Fisicaeng621.3815LC TK787453.5.44Photo-excited processes, diagnostics, and applications :fundamentals and advanced topics /edited by A. PeledBoston :Kluwer,c2003xv, 370 p. :ill. ;25 cmIncludes indexIntegrated circuitsDesign and constructionMicrotechnologyTestingMicroelectronicsMaterialsPhoton beamsPhotochemistryPeled, Aaron.b1269299228-07-1717-03-04991000937889707536LE006 53.5.42+53.5.44 PEL12006000092951le006-E113.00-l- 00000.i1320494417-03-04LE006 53.5.42+53.5.44 PEL12006000093064le006-E39.68-l- 02020.i1320742819-03-04LE006 53.5.42+53.5.44 PEL12006000093026le006-E39.68-l- 01010.i1320743x19-03-04LE006 53.5.42+53.5.44 PEL12006000093033le006-E39.68-l- 02320.i1320747719-03-04LE006 53.5.42+53.5.44 PEL12006000093040le006-E39.68-l- 00000.i1320748919-03-04LE006 53.5.42+53.5.44 PEL12006000093057le006-E39.68-l- 01010.i1320750719-03-04LE006 53.5.42+53.5.44 PEL12006000177153le006gE39.68-l- 00000.i1581546828-07-17Photo-excited processes, diagnostics, and applications271809UNISALENTOle00617-03-04ma -engmau01