01097nam a2200301 i 450099100086303970753620020507102449.0960523s1973 ne ||| | eng 0444104623b1014013x-39ule_instLE00638161ExLDip.to Fisicaita53.7.16548'.842'02854QD921Head, A.K.461439Computed electron micrographs and defect identification /A.K. Head...[et al.]Amsterdam :North-Holland Publ. Co.,1973x, 400 p. :ill. ;23 cm.Defects in crystalline solids ;7Electron microscopy-Data processingMetals-Defects-Data processing.b1014013x17-02-1727-06-02991000863039707536LE006 53.7.16 HEA12006000059190le006-E0.00-l- 00000.i1016638527-06-02Computed electron micrographs and defect identification186657UNISALENTOle00601-01-96ma -engne 01