01367nam--2200397---450-99000154344020331620090604111305.090-5095-049-3000154344USA01000154344(ALEPH)000154344USA0100015434420040329d1998----km-y0enga50------baengNLy|||z|||001yyExpert evidence comparedrules and practices in the dutch and american criminal justice systemP.T.C. van KampenAntwerpenIntersentia Rechtswetenschappen1998XVIII, 401 p.24 cm.Processo penaleProve testimonialiStati Uniti d'AmericaProcesso penaleProve testimonialiPaesi Bassi345.73067KAMPEN,P.T.C. : van560242ITsalbcISBD990001543440203316XXVI.2.D 42 (IG XXI 658)37344 G.XXVI.2.D 42 (IG XXI)00087824BKGIUALINA1020040329USA011301PATRY9020040406USA011747ALESSANDRA9020040607USA011120RENATO9020040706USA011345RENATO9020040706USA011346RSIAV59020090604USA011113Expert evidence compared940424UNISA01050nam a2200289 i 450099100084831970753620020507102244.0960320s1966 us ||| | eng b10138031-39ule_instLE00637880ExLDip.to Fisicaita621.3.1621.3.2621.381528TK7872.T73Thornton, Richard D.26572Characteristics and limitations of transistors /Richard D. Thornton...[et al.]New York :John Wiley & Sons,1966xii, 180 p. :ill. ;22 cm.Semiconductor electronics education committee books ;4Transistors.b1013803117-02-1727-06-02991000848319707536LE006 621.3.1+621.3.2 THO12006000054034le006-E0.00-l- 00000.i1016321927-06-02Characteristics and limitations of transistors185585UNISALENTOle00601-01-96ma -engus 01