01755nam a2200349 i 4500991000377489707536090608s2007 nyua b 001 0 eng d97803872926010387292608b13848215-39ule_instDip.to Ingegneria dell'Innovazioneeng621.3815222LC QC176.83Alford, Terry L.471832Fundamentals of nanoscale film analysis /Terry L. Alford, Leonard C. Feldman and James W. MayerNew York, N.Y. ;London :Springer,c2007xiv, 336 p. :ill. ;25 cmIncludes bibliographical references and indexThin filmsNanostructured materialsFeldman, Leonard C.Mayer, James W.,1930-Table of contents onlyhttp://www.loc.gov/catdir/toc/fy0713/2005933265.html.b1384821508-06-2224-09-09991000377489707536LE026 621.38152 D ALF 01.01 2007C.112026000051413le026Prof. Lovergine / BibliotecapE74.95-n- 18080.i1500665724-09-09LE026 621.38152 D ALF 01.01 C.2 2007C.212026000055275le026Prof. Lovergine / BibliotecapE74.95-l- 0111110.i1508786411-03-10LE026 621.38152 D ALF 01.01 C.3 2007C.312026000055268le026Prof. Lovergine / BibliotecapE74.95-no 46360.i1508776111-03-10LE006 53.7.8+53.8.3 ALF12006000175548le006pE89.19-l- 01040.i1578019312-09-16Fundamentals of nanoscale film analysis228247UNISALENTOle026le00608-06-09ma -engnyu00