01159nam 2200337 450 99658116470331620230817181007.01-7281-1170-6(CKB)4100000008698563(WaSeSS)IndRDA00123140(EXLCZ)99410000000869856320200516d2019 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierVTS 2019 IEEE 37th VLSI Test Symposium : 23-25 April 2019, Monterey, CA, USA /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2019.1 online resource (601 pages)1-7281-1171-4 Integrated circuitsVery large scale integrationTestingCongressesIntegrated circuitsVery large scale integrationTesting621.395Institute of Electrical and Electronics Engineers,WaSeSSWaSeSSPROCEEDING996581164703316VTS2532188UNISA