01407nam 2200361 450 99658087080331620230808204309.01-4673-8259-0(CKB)4100000008867424(WaSeSS)IndRDA00120302(EXLCZ)99410000000886742420200316d2016 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierProceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 18-21 July 2016, Marina Bay Sand, Singapore /sponsored by IEEE [and six others]Piscataway, New Jersey :Institute of Electrical and Electronics Engineers,2016.1 online resource (111 pages)1-4673-8260-4 Integrated circuitsReliabilityCongressesIntegrated circuitsTestingCongressesIntegrated circuitsReliabilityIntegrated circuitsTesting629.831Institute of Electrical and Electronics Engineers,WaSeSSWaSeSSPROCEEDING996580870803316Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)2532474UNISA