01520nam 2200373 450 99657563820331620230415100043.01-7281-6984-4(CKB)5590000000000167(NjHacI)995590000000000167(EXLCZ)99559000000000016720230415d2020 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2020 IEEE International Conference On Artificial Intelligence Testing 3-6 August 2020, Oxford, United Kingdom : proceedings /Franz Wotawa [and eight-six others]Pistacaway, New Jersey :IEEE,2020.1 online resource (x, 141 pages) illustrationsIncludes index.1-7281-6985-2 Message from the General Chair viii -- Message from the Program Co-Chairs ix -- Committees -- Images -- Autonomous Vehicles -- Metamorphic Testing -- Data -- ML for Testing (I) -- ML for Testing (II) -- Evaluation of ML Algorithms -- Author Index.2020 IEEE International Conference On Artificial Intelligence Testing Artificial intelligenceCongressesArtificial intelligence006.3Wotawa Franz1350795NjHacINjHaclPROCEEDING9965756382033162020 IEEE International Conference On Artificial Intelligence Testing3089795UNISA