01283nam 2200349 450 99657551950331620230415024147.01-7281-8187-9(CKB)5410000000003404(NjHacI)995410000000003404(EXLCZ)99541000000000340420230415d2020 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) /Institute of Electrical and Electronics Engineers[Place of publication not identified] :Institute of Electrical and Electronics Engineers,2020.1 online resource1-7281-8188-7 On Line Testing and Robust Electronic System Design.2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design Robust statisticsCongressesRobust statistics519.5NjHacINjHaclPROCEEDING9965755195033162020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)2505070UNISA