01201nam 2200313 450 99657545750331620231209100007.01-5044-5975-X(CKB)4100000009070607(NjHacI)994100000009070607(EXLCZ)99410000000907060720231209d2019 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 /Institute of Electrical and Electronics Engineers[Place of publication not identified] :IEEE,2019.1 online resource (48 pages)Automatic test equipmentAutomatic test equipment.621.381548NjHacINjHaclDOCUMENT9965754575033161505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 15052582250UNISA