01175nam 2200361 450 99657537640331620230423092026.01-7281-1003-3(CKB)4100000009825451(NjHacI)994100000009825451(EXLCZ)99410000000982545120230423d2019 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2019 IEEE East-West Design & Test Symposium (EWDTS) /Institute of Electrical and Electronics EngineersPiscataway, NJ :IEEE,2019.©20191 online resource (116 pages)1-7281-1004-1 Includes bibliographical references and index.2019 IEEE East-West Design & Test Symposium Electrical engineeringData processingCongressesElectrical engineeringData processing621.30285NjHacINjHaclPROCEEDING9965753764033162019 IEEE East-West Design & Test Symposium (EWDTS)2514509UNISA