01748nam 2200397 450 991013587460332120231207090203.00-7381-9622-3(CKB)3780000000090178(NjHacI)993780000000090178(EXLCZ)99378000000009017820231207d2015 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description /IEEE(Revision of IEEE Std 1671.5-2008).New York, N.Y. :IEEE,2015.1 online resource (viii, 17 pages) illustrationsIncludes bibliographical references.An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.1671.5-2015 - IEEE Standard for Automatic Test Markup Language IEEE Std 1671.5-2015 (Revision of IEEE Std 1671.5-2008): IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter DescriptionIEEE Standard for Automatic Test Markup Language IEEE Std 1671.5-2015 Automatic test equipmentCongressesAutomatic test equipment620.0NjHacINjHaclDOCUMENT9910135874603321IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description3647082UNINA02119nas 2200601- 450 99647637240331620240429134604.02644-1349(DE-599)ZDB3020004-0(OCoLC)1104139985(CKB)4100000009150384(CONSER)--2019200388(EXLCZ)99410000000915038420190610a20219999 --- aengur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE open journal of the Solid-State Circuits SocietyNew York, NY :IEEE Solid-State Circuits Society :Institute of Electrical and Electronics Engineers,[2021]-OJSSCIOJSBGInstitute of Electrical and Electronics Engineers open journal of the Solid-State Circuits SocietySolid-State Circuits SocietyIEEE open j. Solid-State Circuits Soc.Integrated circuitsPeriodicalsSolid state electronicsPeriodicalsSemiconductorsPeriodicalsIntegrated circuitsfast(OCoLC)fst00975535Semiconductorsfast(OCoLC)fst01112198Solid state electronicsfast(OCoLC)fst01125449Electrònica de l'estat sòlidthubSemiconductorsthubCircuits integratsthubPeriodicals.fastRevistes electròniquesthubIntegrated circuitsSolid state electronicsSemiconductorsIntegrated circuits.Semiconductors.Solid state electronics.Electrònica de l'estat sòlidSemiconductorsCircuits integrats621.3815Institute of Electrical and Electronics Engineers.IEEE Solid-State Circuits Society.JOURNAL996476372403316IEEE open journal of the Solid-State Circuits Society2788160UNISA01985nas 2200553 c 450 991089315240332120250513224304.0(CKB)5280000000196648(DE-599)ZDB2478657-3(OCoLC)1184254736(OCoLC)643287219(DE-101)992574382(EXLCZ)99528000000019664820090209b20072015 |y |gerur|||||||||||txtrdacontentcrdamediacrrdacarrierHilfe für Migranten / Caritas Bodensee-OberschwabenJahresbericht ... ; MigrationsberatungRavensburgCaritas[2007-2015]Online-RessourceEinblickeGesehen am 26.11.18Hilfen für MigrantenEinwanderer(DE-588)4151434-8https://d-nb.info/gnd/4151434-8(DE-101)041514343gndBeratung(DE-588)4005565-6https://d-nb.info/gnd/4005565-6(DE-101)040055655gndHilfe(DE-588)4444536-2https://d-nb.info/gnd/4444536-2(DE-101)949892912gndEinwanderer(DE-588)4151434-8https://d-nb.info/gnd/4151434-8(DE-101)041514343gndBeratung(DE-588)4005565-6https://d-nb.info/gnd/4005565-6(DE-101)040055655gndHilfe(DE-588)4444536-2https://d-nb.info/gnd/4444536-2(DE-101)949892912gndMigrationsberatung(DE-588)1179393023https://d-nb.info/gnd/1179393023(DE-101)1179393023gndZeitschriftgnd-contentBerichtgnd-contentEinwanderer.Beratung.Hilfe.Einwanderer.Beratung.Hilfe.Migrationsberatung.3600024DE-1014022JOURNAL9910893152403321Hilfe für Migranten4246592UNINA