02875nam 22005655 450 99646648270331620221020220643.03-540-93913-X10.1007/978-3-540-93913-9(CKB)1000000000718092(SSID)ssj0000317288(PQKBManifestationID)11267296(PQKBTitleCode)TC0000317288(PQKBWorkID)10293138(PQKB)10150678(DE-He213)978-3-540-93913-9(MiAaPQ)EBC3064140(PPN)134130839(EXLCZ)99100000000071809220100301d2009 u| 0engurnn#008mamaatxtccrDonaldson Type Invariants for Algebraic Surfaces[electronic resource] Transition of Moduli Stacks /by Takuro Mochizuki1st ed. 2009.Berlin, Heidelberg :Springer Berlin Heidelberg :Imprint: Springer,2009.1 online resource (XXIII, 383 p.)Lecture Notes in Mathematics,0075-8434 ;1972Bibliographic Level Mode of Issuance: Monograph3-540-93912-1 Includes bibliographical references (p. 341-345) and index.Preliminaries -- Parabolic L-Bradlow Pairs -- Geometric Invariant Theory and Enhanced Master Space -- Obstruction Theories of Moduli Stacks and Master Spaces -- Virtual Fundamental Classes -- Invariants.We are defining and studying an algebra-geometric analogue of Donaldson invariants by using moduli spaces of semistable sheaves with arbitrary ranks on a polarized projective surface. We are interested in relations among the invariants, which are natural generalizations of the "wall-crossing formula" and the "Witten conjecture" for classical Donaldson invariants. Our goal is to obtain a weaker version of these relations, by systematically using the intrinsic smoothness of moduli spaces. According to the recent excellent work of L. Goettsche, H. Nakajima and K. Yoshioka, the wall-crossing formula for Donaldson invariants of projective surfaces can be deduced from such a weaker result in the rank two case!Lecture Notes in Mathematics,0075-8434 ;1972Algebraic geometryAlgebraic Geometryhttps://scigraph.springernature.com/ontologies/product-market-codes/M11019Algebraic geometry.Algebraic Geometry.516.3514D2014J6014J80mscMAT 142fstubMAT 146fstubSI 850rvkMochizuki Takuroauthttp://id.loc.gov/vocabulary/relators/aut319920BOOK996466482703316Donaldson type invariants for algebraic surfaces230294UNISA03790nam 22007335 450 991068335290332120251008160422.09783031197222(electronic bk.)978303119721510.1007/978-3-031-19722-2(MiAaPQ)EBC7219546(Au-PeEL)EBL7219546(OCoLC)1374256005(DE-He213)978-3-031-19722-2(PPN)269098496(CKB)26387394800041(EXLCZ)992638739480004120230323d2023 u| 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierAdvanced Optical Spectroscopy Techniques for Semiconductors Raman, Infrared, and Cathodoluminescence Spectroscopy /by Masanobu Yoshikawa1st ed. 2023.Cham :Springer International Publishing :Imprint: Springer,2023.1 online resource (227 pages)Print version: Yoshikawa, Masanobu Advanced Optical Spectroscopy Techniques for Semiconductors Cham : Springer International Publishing AG,c2023 9783031197215 Includes bibliographical references and index.1. Introduction -- 2. Raman and infrared (IR) spectroscopy -- 3. Photoluminescence (PL) spectroscopy -- 4. Overview of cathodoluminescence (CL) spectroscopy -- 5. Applications of Raman, IR, and CL spectroscopy -- 6. STEM-CL spectroscopy -- 7. Topics -- Index.This book focuses on advanced optical spectroscopy techniques for the characterization of cutting-edge semiconductor materials. It covers a wide range of techniques such as Raman, infrared, photoluminescence, and cathodoluminescence (CL) spectroscopy, including an introduction to their physical fundamentals and best operating principles. Aimed at professionals working in the research and development of semiconductors and semiconductor materials, this book looks at a broad class of materials such as silicon and silicon dioxide, nano-diamond thin films, quantum dots, and gallium oxide. In addition to the spectroscopic techniques covered, this book features a chapter devoted to the use of a scanning electron transmission microscope as an excitation source for CL spectroscopy. Written by a practicing industry expert in the field, this book is an ideal source of reference and best-practices guide for physicists, as well as materials scientists and engineers involved in the area of spectroscopy of semiconductor materials. Further, this book introduces the cutting-edge spectroscopy such as optical photothermal IR and Raman spectroscopy or terahertz time-domain spectroscopy (THz-TDS) etc.SemiconductorsOptical spectroscopyNanotechnologyQuantum dotsPower electronicsMaterialsMicroscopySemiconductorsOptical SpectroscopyNanotechnologyQuantum DotsPower ElectronicsMicroscopySemiconductors.Optical spectroscopy.Nanotechnology.Quantum dots.Power electronics.MaterialsMicroscopy.Semiconductors.Optical Spectroscopy.Nanotechnology.Quantum Dots.Power Electronics.Microscopy.543.5535.84Yoshikawa Masanobu1349102MiAaPQMiAaPQMiAaPQ9910683352903321Advanced Optical Spectroscopy Techniques for Semiconductors3087040UNINA