01349nam 2200361Ia 450 99639204840331620221108000905.0(CKB)1000000000678552(EEBO)2264226540(OCoLC)12538706(EXLCZ)99100000000067855219850912d1687 uy |engurbn#|||a|bb|The pillar and ground of truth[electronic resource] a treatise shewing that the Roman Chvrch falsly claims to be that church, and the pillar of that truth, mentioned by S. Paul in his First epistle to Timothy, Chap. III. vers. 15, which is explained in three partsLondon Printed for Richard Chiswell ...1687[10], 126, [3] pAdvertisement: p. [1]-[3] at end.Includes bibliographical references.Also ascribed to William Sherlock. cf. Halkett and Laing.Reproduction of originals in Duke University Library and Huntington Library.eebo-0113Patrick Simon1626-1707.845411Sherlock William1641?-1707.322284EAAEAAm/cUMIWaOLNBOOK996392048403316The pillar and ground of truth2332059UNISA05168nam 2200625 a 450 991083056570332120230421044144.01-281-76465-597866117646543-527-62052-43-527-62053-2(CKB)1000000000540648(EBL)712161(SSID)ssj0000167861(PQKBManifestationID)11161505(PQKBTitleCode)TC0000167861(PQKBWorkID)10179008(PQKB)10394891(MiAaPQ)EBC712161(OCoLC)264621141(EXLCZ)99100000000054064820120114d1997 uy 0engur|n|---|||||txtccrMethods II[electronic resource] /edited by S. Amelinckx ... [et al.]Weinheim VCH19971 online resource (509 p.)Handbook of microscopy : applications in materials science, solid-state physics, and chemistry ;[v. 2]Description based upon print version of record.3-527-29473-2 Includes bibliographical references and index.Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry2.5.1.12 Energy-Dispersive SpectrometryComprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.With the Handbook of Microscopy, scientists and engineers involved in mMicroscopyMaterialsMicroscopyMicroscopy.MaterialsMicroscopy.502.82502/.8/2Amelinckx S50786MiAaPQMiAaPQMiAaPQBOOK9910830565703321Methods II3061935UNINA