02662nam 2200385 450 99657498650331620231214123445.01-5044-8875-X10.1109/IEEESTD.2022.9919140(CKB)4100000012897135(NjHacI)994100000012897135(EXLCZ)99410000001289713520231214d2022 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier1149.7-2022 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture /IEEENew York :IEEE,2022.1 online resource (1048 pages)Circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1 is described in this standard. The circuitry uses IEEE Std 1149.1 as its foundation, providing complete backward compatibility, while aggressively adding features to support test and applications debug. It defines six classes of IEEE 1149.7 Test Access Ports (TAP.7s), T0 to T5, with each class providing incremental capability, building on that of the lower level classes. Class T0 provides the behavior specified by 1149.1 from startup when there are multiple on-chip TAPs. Class T1 adds common debug functions and features to minimize power consumption. Class T2 adds operating modes that maximize scan performance. It also provides an optional hot-connection capability to prevent system corruption when a connection is made to a powered system. Class T3 supports operation in either a four-wire Series or Star Scan Topology. Class T4 provides for communication with either a two-pin or four-pin interface. The two-pin operation serializes IEEE 1149.1 transactions and provides for higher Test Clock rates. Class T5 adds the ability to perform data transfers concurrently with scan, supports utilization of functions other than scan, and provides control of TAP.7 pins to custom debug technologies in a manner that ensures current and future interoperability.Electronic controllersDebugging in computer scienceBoundary scan testingElectronic controllers.Debugging in computer science.Boundary scan testing.621.46NjHacINjHaclDOCUMENT9965749865033161149.7-2022 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture3882245UNISA03173nas 2200865-a 450 99633623300331620240413024749.0(CKB)110984073530396(CONSER)sn-99009416-(EXLCZ)9911098407353039619991013b19992000 --- aengtxtrdacontentcrdamediacrrdacarrierLibrary computingThousand Oaks, CA Sage Publications©1999-©20001 online resourceRefereed/Peer-reviewedTitle from cover.Published: West Yorkshire, England : MCB University Press, -2000.Print version: Library computing (Thousand Oaks, Ventura County, Calif.) 1527-1161 (DLC)sn 99009416 (OCoLC)42632160 LIBRARY COMPUTINGLibrary comput.Library scienceComputer programsPeriodicalsComputer programsPeriodicalsLibrary scienceData processingPeriodicalsLibrariesAutomationPeriodicalsEducationComputer programsPeriodicalsWorld Wide WebPeriodicalsBibliothéconomieLogicielsPériodiquesLogicielsPériodiquesBibliothéconomieInformatiquePériodiquesDidacticielsPériodiquesBibliothèquesAutomatisationPériodiquesWebPériodiquesComputer programsfast(OCoLC)fst00872410EducationComputer programsfast(OCoLC)fst00902543LibrariesAutomationfast(OCoLC)fst00997347Library scienceComputer programsfast(OCoLC)fst00997927Library scienceData processingfast(OCoLC)fst00997930World Wide Webfast(OCoLC)fst01181326BibliotheekautomatiseringgttInternetgttBibliothekDatenverarbeitungZeitschriftswdDatenverarbeitungBibliothekZeitschriftswdPeriodicals.fastLibrary scienceComputer programsComputer programsLibrary scienceData processingLibrariesAutomationEducationComputer programsWorld Wide WebBibliothéconomieLogicielsLogicielsBibliothéconomieInformatiqueDidacticielsBibliothèquesAutomatisationWebComputer programs.EducationComputer programs.LibrariesAutomation.Library scienceComputer programs.Library scienceData processing.World Wide Web.Bibliotheekautomatisering.Internet.BibliothekDatenverarbeitungDatenverarbeitungBibliothek001JOURNAL996336233003316exl_impl conversionLibrary computing2344810UNISA