01782nam 2200457 450 99628113610331620230803194719.01-4799-3929-3(CKB)2560000000337422(WaSeSS)IndRDA00096365(WaSeSS)IndRDA00124057(EXLCZ)99256000000033742220200602d2014 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIPFA proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore /organised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2014.1 online resource (291 pages)1-4799-3911-0 1-4799-3931-5 Integrated circuitsReliabilityCongressesIntegrated circuitsTestingCongressesSemiconductorsFailuresCongressesIntegrated circuitsDefectsCongressesIntegrated circuitsReliabilityIntegrated circuitsTestingSemiconductorsFailuresIntegrated circuitsDefects621.3815Institute of Electrical and Electronics Engineers,IEEE Singapore Section.Reliability/CPMT/EDS Chapter,IEEE Electron Devices Society,WaSeSSWaSeSSPROCEEDING996281136103316IPFA2524857UNISA