02261nas 22006253 450 99628110740331620230120003706.02378-2250(OCoLC)61145658(CKB)110978978384273(CONSER)--2015202262(EXLCZ)9911097897838427320050726a19839999 --- aengurun|||||||||txtrdacontentcrdamediacrrdacarrierProceedings /International Test Conference[Silver Spring, Md.] :[IEEE Computer Society Press]Altoona, PA :International Test ConferenceWashington, D.C. :International Test ConferenceSome conferences also have distinctive titles.Published: Altoona, PA : International Test Conference, <1995->1089-3539 International Test ConferenceITCIEEE ... Test ConferenceIEEE International Test ConferenceProceedings of the International Test ConferenceINTERNATIONAL TEST CONFERENCE PROCEEDINGSINTERNATIONAL TEST CONFERENCEProc.Computer storage devicesCongressesIntegrated circuitsTestingCongressesSemiconductor storage devicesTestingCongressesComputer storage devicesfast(OCoLC)fst00872634Integrated circuitsTestingfast(OCoLC)fst00975593Semiconductor storage devicesTestingfast(OCoLC)fst01112185Periodicals.fastConference papers and proceedings.fastComputer storage devicesIntegrated circuitsTestingSemiconductor storage devicesTestingComputer storage devices.Integrated circuitsTesting.Semiconductor storage devicesTesting.004004IEEE Computer Society.Institute of Electrical and Electronics Engineers.CONFERENCE996281107403316Proceedings57126UNISA