01976nas 2200493-a 450 99628090330331620200722081416.72162-061X(OCoLC)321587528(CKB)2560000000075754(CONSER)--2011204105(EXLCZ)99256000000007575420090217b200u201u s-- aengurmn|||||||||txtrdacontentcrdamediacrrdacarrierProceedingsPiscataway, NJ IEEE2162-0601 International Design and Test WorkshopIDTIEEE International Design and Test WorkshopInt. Des. Test WorkshopIntegrated circuitsVery large scale integrationDesign and constructionCongressesIntegrated circuitsVery large scale integrationTestingCongressesIntegrated circuitsFault toleranceCongressesIntegrated circuitsFault tolerancefast(OCoLC)fst00975563Integrated circuitsVery large scale integrationDesign and constructionfast(OCoLC)fst00975610Integrated circuitsVery large scale integrationTestingfast(OCoLC)fst00975618Conference papers and proceedings.fastIntegrated circuitsVery large scale integrationDesign and constructionIntegrated circuitsVery large scale integrationTestingIntegrated circuitsFault toleranceIntegrated circuitsFault tolerance.Integrated circuitsVery large scale integrationDesign and construction.Integrated circuitsVery large scale integrationTesting.621.39Institute of Electrical and Electronics Engineers.CONFERENCE996280903303316Proceedings57126UNISA