01228nam 2200349 450 99628084800331620231206214058.01-5044-0275-8(CKB)3710000000589849(NjHacI)993710000000589849(EXLCZ)99371000000058984920231206d1968 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE No 300-1969 (USAS N42.1-1969) USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation) /Institute of Electrical and Electronics EngineersNew York :IEEE,1968.1 online resource (34 pages)300-1969 - USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors IEEE No 300-1969 Ionizing radiationIonizing radiation.539.2NjHacINjHaclDOCUMENT996280848003316IEEE No 300-1969 (USAS N42.1-1969)3646700UNISA