01968oam 2200505zu 450 99628084590331620210807002616.01-5090-8269-7(CKB)1000000000331428(SSID)ssj0000395466(PQKBManifestationID)12171114(PQKBTitleCode)TC0000395466(PQKBWorkID)10454138(PQKB)10368537(EXLCZ)99100000000033142820160829d2007 uy engtxtccr2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan[Place of publication not identified]IEEE2007Bibliographic Level Mode of Issuance: Monograph1-4244-0780-X 1-4244-0781-8 Integrated circuitsTestingCongressesSemiconductorsTestingCongressesElectronic apparatus and appliancesTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingSemiconductorsTestingElectronic apparatus and appliancesTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical EngineeringIEEE Xplore (Online service)IEEE Electron Devices SocietyIEEE International Conference on Microelectronic Test StructuresPQKBPROCEEDING9962808459033162007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan2529220UNISA