01023cam0 2200289 450 E60020003562220210202073812.0052129385520080314d1982 |||||ita|0103 baengGBMarket structure and innovationMorton I. KamienNancy L. SchwartzLondonCambidge University1982XI, 243 p.21 cmCambridge Surveys of Economic Literature001LAEC000247782001 *Cambridge Surveys of Economic LiteratureKamien, Morton I.A600200047383070104567Schwartz, Nancy L.A600200047384070ITUNISOB20210202RICAUNISOBUNISOB30043327E600200035622M 102 Monografia moderna SBNM300001649Si43327Acquistopregresso2UNISOBUNISOB20080314114449.020190711124612.0SpinosaMarket structure and innovation1683098UNISOB02193nas 2200601- 450 99628075300331620230518213020.02573-3060(OCoLC)881466269(CKB)3710000000537658(CONSER)--2017202102(EXLCZ)99371000000053765820140618a20119999 o-- aengur|||||||||||txtrdacontentcrdamediacrrdacarrierSeGAH ... IEEE ... International Conference on Serious Games and Applications for Health book of proceedingsPiscataway, NJ :IEEE,[2011]-Red Hook, NY :Available from Curran Associates1 online resource2330-5649 Serious Games and Applications for Health (SeGAH), IEEE International Conference onIEEE International Conference on Serious Games and Applications for Health (SeGAH ...)SeGAH IEEE ... Int. Conf. Serious Games and Appl. HealthSeGAH IEEE Int Conf Serious Games Appl HealthMedicineComputer simulationCongressesComputer gamesCongressesComputer SimulationMedicineVideo GamesMedical InformaticsComputer gamesfast(OCoLC)fst00872108MedicineComputer simulationfast(OCoLC)fst01014921Congress.Conference papers and proceedings.fastMedicineComputer simulationComputer gamesComputer Simulation.Medicine.Video Games.Medical Informatics.Computer games.MedicineComputer simulation.610Institute of Electrical and Electronics Engineers,IEEE Computer Society,Instituto Politécnico do Cávado e do Ave,CONFERENCE996280753003316SeGAH ... IEEE ... International Conference on Serious Games and Applications for Health2546510UNISA04401nam 22008655 450 991030041070332120200701162733.04-431-55028-310.1007/978-4-431-55028-0(CKB)3710000000244788(EBL)1968611(OCoLC)908090065(SSID)ssj0001354154(PQKBManifestationID)11896012(PQKBTitleCode)TC0001354154(PQKBWorkID)11322535(PQKB)10917624(DE-He213)978-4-431-55028-0(MiAaPQ)EBC1968611(PPN)181354497(EXLCZ)99371000000024478820140920d2015 u| 0engur|n|---|||||txtccrHigh-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films /by Akari Takayama1st ed. 2015.Tokyo :Springer Japan :Imprint: Springer,2015.1 online resource (92 p.)Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053Description based upon print version of record.4-431-55027-5 Includes bibliographical references.Introduction -- Basic Principle of Photoemission Spectroscopy and Spin Detector -- Development of High Resolution Spin-Resolved Photoemission Spectrometer -- Anomalous Rashba Effect of a Bi Thin Film on Si(111) -- Rashba Effect at Interface of a Bi Thin Film on Si(111) -- Conclusion.In this thesis, the author has developed a high-resolution spin-resolved photoemission spectrometer that achieves the world-best energy resolution of 8 meV. The author has designed a new, highly efficient mini Mott detector that has a large electron acceptance angle and an atomically flat gold target to enhance the efficiency of detecting scattered electrons.   The author measured the electron and spin structure of Bi thin film grown on a Si(111) surface to study the Rashba effect. Unlike the conventional Rashba splitting, an asymmetric in-plane spin polarization and a tremendous out-of-plane spin component were observed. Moreover, the author found that the spin polarization of Rashba surface states is reduced by decreasing the film thickness, which indicates the considerable interaction of Rashba spin-split states between the surface and Bi/Si interface.Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053Surfaces (Physics)Interfaces (Physical sciences)Thin filmsSpectrum analysisMicroscopyMaterials—SurfacesPhysical measurementsMeasurementSemiconductorsSurface and Interface Science, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/P25160Spectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Surfaces and Interfaces, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/Z19000Measurement Science and Instrumentationhttps://scigraph.springernature.com/ontologies/product-market-codes/P31040Semiconductorshttps://scigraph.springernature.com/ontologies/product-market-codes/P25150Surfaces (Physics)Interfaces (Physical sciences)Thin films.Spectrum analysis.Microscopy.Materials—Surfaces.Physical measurements.Measurement.Semiconductors.Surface and Interface Science, Thin Films.Spectroscopy and Microscopy.Surfaces and Interfaces, Thin Films.Measurement Science and Instrumentation.Semiconductors.530530.417530.8537.622Takayama Akariauthttp://id.loc.gov/vocabulary/relators/aut792815BOOK9910300410703321High-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films1773052UNINA