01514nam 2200397 450 99628073180331620231212123357.00-7381-4694-310.1109/IEEESTD.2005.96465(CKB)3780000000090109(NjHacI)993780000000090109(EXLCZ)99378000000009010920231212d2005 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 1500-2005 IEEE Standard Testability Method for Embedded Core-based Integrated Circuits /Institute of Electrical and Electronics EngineersNew York, NY :IEEE,2005.1 online resource (viii, 117 pages) illustrations (some color)This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.IEEE Std 1500-2005Embedded computer systemsIntegrated circuitsTestingSystems on a chipEmbedded computer systems.Integrated circuitsTesting.Systems on a chip.004.16NjHacINjHaclDOCUMENT996280731803316IEEE Std 1500-20053646594UNISA