01380nam 2200385 450 99628070960331620230814223051.01-5386-5071-1(CKB)4100000005061441(WaSeSS)IndRDA00122224(EXLCZ)99410000000506144120200428d2018 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2018 IEEE International Conference on Microelectronic Test Structures 19-22 March 2018, Austin, TX, USA /IEEE Electron Devices SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2018.1 online resource (78 pages)1-5386-5072-X Integrated circuitsTestingCongressesSemiconductorsTestingCongressesElectronic apparatus and appliancesTestingCongressesIntegrated circuitsTestingSemiconductorsTestingElectronic apparatus and appliancesTesting621.381548IEEE Electron Devices Society,WaSeSSWaSeSSPROCEEDING9962807096033162018 IEEE International Conference on Microelectronic Test Structures2520360UNISA