01768nam 2200373 450 99628067060331620231208090741.00-7381-4361-810.1109/IEEESTD.1976.120672(CKB)3780000000092929(NjHacI)993780000000092929(EXLCZ)99378000000009292920231208d1976 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 301-1976 /Institute of Electrical and Electronics Engineer[Place of publication not identified] :IEEE,1976.1 online resource (30 pages)This standard provides standard test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation. It supersedes the previous edition, IEEE Std 301-1969 (ANSI N42.2-1969). The standard has been modified and refined based on the experience gained in using the earlier edition over a six-year period and taking into account advances in the technology. Improvements in preamplifier noise characteristics and pulse shaping techniques as well as increased utilization of integral detector-preamplifier assemblies have occurred in recent years.IEEE Std 301-1976: IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semi- Conductor Radiation Detectors for Ionizing RadiationAmplifiers (Electronics)Power amplifiersAmplifiers (Electronics)Power amplifiers.621.381535NjHacINjHaclDOCUMENT996280670603316IEEE Std 301-19762573556UNISA