00991nam--2200349---450-99000225925020331620090114164155.0000225925USA01000225925(ALEPH)000225925USA0100022592520041210d1969----km-y0itay0103----baengUS||||||||001yyStatistical sales forecastingVernon G. LippittNew YorkFinancial Executives Research Foundation1969VII, 347 p.24 cm20012001001-------2001310LIPPITT,Vernon G.495917ITsalbcISBD990002259250203316310 LIP 1 (IRA 15 15)17451 E.C.IRA 1500011297BKECOSIAV11020041210USA011659RSIAV29020090114USA011641Statistical sales forecasting1066514UNISA01755nam 2200385 450 99628021420331620230425080556.01-4673-6578-510.1109/ITC33753.2015(CKB)3710000000534614(NjHacI)993710000000534614(EXLCZ)99371000000053461420230425d2015 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierTest Conference (ITC), 2015 IEEE International /Institute of Electrical and Electronics EngineersPiscataway, NJ :IEEE,2015.1 online resource (various pagings) illustrations1-4673-6579-3 International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.2015 IEEE International Test Conference 2015 IEEE International Test Conference (ITC)Test Conference Computer softwareTestingCongressesComputer softwareTesting005.14NjHacINjHaclPROCEEDING996280214203316Test Conference (ITC), 2015 IEEE International2536343UNISA