01311nam 2200385 450 99628021380331620230803215436.01-4799-3415-1(CKB)3830000000000576(WaSeSS)IndRDA00119800(EXLCZ)99383000000000057620200310d2014 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2014 19th IEEE European Test Symposium 26-30 May 2014, Paderborn, Germany /IEEE Computer SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2014.1 online resource (68 pages)1-4799-3416-X Integrated circuitsTestingCongressesAutomatic test equipmentCongressesElectronic digital computersCircuitsTestingCongressesIntegrated circuitsTestingAutomatic test equipmentElectronic digital computersCircuitsTesting621.381548IEEE Computer Society,WaSeSSWaSeSSPROCEEDING9962802138033162014 19th IEEE European Test Symposium2503661UNISA