01088nam 2200349 450 99628021300331620230425223018.01-4799-0859-2(CKB)3460000000126470(NjHacI)993460000000126470(EXLCZ)99346000000012647020230425d2013 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2013 IEEE International Test Conference (ITC) /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :IEEE,2013.1 online resource (497 pages)1-4799-0860-6 2013 IEEE International Test Conference Test Conference Computer softwareTestingCongressesComputer softwareTesting005.30287NjHacINjHaclPROCEEDING9962802130033162013 IEEE International Test Conference (ITC)2526947UNISA