01301nam 2200385 450 99628006910331620230814230356.01-5386-9466-2(CKB)4100000007213033(WaSeSS)IndRDA00121940(EXLCZ)99410000000721303320200416d2018 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2018 IEEE 27th Asian Test Symposium 15-18 October 2018, Hefei, China /IEEE Computer SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2018.1 online resource (79 pages)1-5386-9467-0 Electronic digital computersTestingCircuitsCongressesElectronic circuitsTestingCongressesFault-tolerant computingCongressesElectronic digital computersTestingCircuitsElectronic circuitsTestingFault-tolerant computing621.3815IEEE Computer Society,WaSeSSWaSeSSPROCEEDING9962800691033162018 IEEE 27th Asian Test Symposium2528000UNISA