01723nas 22004453 450 99627999450331620181031051803.52377-7966(OCoLC)57375271(CKB)111088195290232(CONSER)--2015201805(EXLCZ)9911108819529023220050106b19962010 --- aengurcn||||||m||txtrdacontentcrdamediacrrdacarrierProceedings /IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : (DFT)Los Alamitos, Calif. :IEEE Computer Society Press,1996-2010.Los Alamitos, Calif. :IEEE Computer Society15 volumes1550-5774 Integrated circuitsVery large scale integrationDesign and constructionCongressesIntegrated circuitsFault toleranceCongressesIntegrated circuitsFault tolerancefast(OCoLC)fst00975563Integrated circuitsVery large scale integrationDesign and constructionfast(OCoLC)fst00975610Electronic journals.Conference papers and proceedings.fastPeriodicals.fastIntegrated circuitsVery large scale integrationDesign and constructionIntegrated circuitsFault toleranceIntegrated circuitsFault tolerance.Integrated circuitsVery large scale integrationDesign and construction.621.39/5IEEE Computer Society.CONFERENCE996279994503316Proceedings57126UNISA