01996nas 2200541-a 450 99627989510331620240202213016.0(OCoLC)135066057(CKB)1000000000428473(CONSER)--2007242231(EXLCZ)99100000000042847320070524b20032016 s-- aengurcn|||||||||txtrdacontentcrdamediacrrdacarrierProceedings /IEEE International On-Line Testing SymposiumLos Alamitos, Calif. IEEE Computer Society©2003-Title from PDF of original t.p. (IEEE Xplore, viewed May 24, 2007).1942-9398 IOLTSProc.Electronic circuitsTestingCongressesOnline data processingCongressesElectronic circuit designCongressesError-correcting codes (Information theory)CongressesElectronic circuit designfast(OCoLC)fst00906862Electronic circuitsTestingfast(OCoLC)fst00906898Error-correcting codes (Information theory)fast(OCoLC)fst00915036Online data processingfast(OCoLC)fst01045942Periodicals.fastConference papers and proceedings.fastElectronic circuitsTestingOnline data processingElectronic circuit designError-correcting codes (Information theory)Electronic circuit design.Electronic circuitsTesting.Error-correcting codes (Information theory)Online data processing.621Institute of Electrical and Electronics Engineers.IEEE Computer Society.Technical Council on Test Technology.CONFERENCE996279895103316Proceedings57126UNISA