01487nam 2200373 450 99627989010331620231206165429.01-5044-0864-0(CKB)3710000000644123(NjHacI)993710000000644123(EXLCZ)99371000000064412320231206d2016 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEC 61671-4 Edition 1.0 2016-04 IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration /Institute of Electrical and Electronics Engineers[Place of publication not identified] :IEEE,2016.1 online resource (60 pages)An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).61671-4-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language IEC 61671-4 Edition 1.0 2016-04DetectorsMeasuring instrumentsDetectors.Measuring instruments.681.2NjHacINjHaclDOCUMENT996279890103316IEC 61671-4 Edition 1.0 2016-043646121UNISA