01139nam 2200361 450 99627967950331620180319105917.01-5386-3051-6(CKB)4100000000884308(WaSeSS)IndRDA00095503(EXLCZ)99410000000088430820180319d2017 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierITC-Asia 2017 International Test Conference in Asia : 13-15 September 2017New York :IEEE,2017.1 online resource (145 pages)1-5386-3052-4 Integrated circuitsTestingCongressesElectronic systemsTestingCongressesElectronic digital computersCircuitsTestingCongressesIntegrated circuitsTestingElectronic systemsTestingElectronic digital computersCircuitsTestingWaSeSSWaSeSSPROCEEDING996279679503316ITC-Asia2498306UNISA