01529nam 2200385 450 99627960610331620231209090610.01-5044-4567-810.1109/IEEESTD.2018.8337144(CKB)4100000005061679(NjHacI)994100000005061679(EXLCZ)99410000000506167920231209d2018 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description /Institute of Electrical and Electronics EngineersNew York, New York :IEEE,2018.1 online resource (747 pages)An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.1671.3-2017 - IEEE Standard for Automatic Test Markup Language IEEE Std 1671.3-2017 Digital electronicsStandardsStandards, EngineeringDigital electronicsStandards.Standards, Engineering.621.3NjHacINjHaclDOCUMENT996279606103316IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007)3647570UNISA